A fully digital integrated accelerometer having new sensing element is desi
gned and fabricated based on CMOS process and micromachining. The sensing e
lements of this accelerometer are constructed on the bulk silicon proof mas
s with metal air-gap MOSFETs (MAMOS) whose drain current is proportional to
the applied acceleration. Current controlled oscillator converts the chang
e of this drain current to digital pulse train. Twenty-bit synchronous bina
ry counter is monolithically integrated to digitize the output pulse of the
oscillator. Bulk micromachined silicon proof mass provides perfect electri
cal isolation of MOSFET sensing elements from CMOS readout circuit. A CMOS
compatible doping and annealing process for this MEMS polysilicon is develo
ped to optimize the trade-off between the mechanical properties and electri
cal requirements. Through the slightly modified 1.5 mu m CMOS circuit proce
ss followed by anisotropic silicon etch, integrated digital silicon acceler
ometer is fabricated. Measured sensitivity of the fabricated accelerometer
is 125 kHz/g.