Jh. Sim et al., Simulation and characterization of a piezoresistive accelerometer with self-canceling off-axis sensitivity, J KOR PHYS, 33, 1998, pp. S427-S431
A six-beam piezoresistive accelerometer with self-canceling off-axis sensit
ivity was fabricated on a selectively diffused (Ill)-oriented n/n(+)/n sili
con substrate. A unique porous silicon micromachining technique which has s
elf-stop characteristics and produces a highly selective formation of the p
orous silicon layer during the anodic reaction was used. The canceling effe
cts of off-axis sensitivity were investigated using the finite-dement metho
d (FEM) simulation program ANSYS, and the resulting characteristics of the
fabricated accelerometer were experimentally investigated. The six-beam str
ucture provides a lower off-axis sensitivity than two- or four-beam structu
res and is mechanically more stable due to smaller shear stress. The compar
atively low sensitivity to normal accelerations, due to the additional beam
s, can be simply overcome using a summing circuit. This also sharply reduce
s the off-axis sensitivity.