Citation
E. Dimasi et al., X-ray reflectivity study of temperature-dependent surface layering in liquid Hg, PHYS REV B, 58(20), 1998, pp. R13419-R13422
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829
→ ACNP
Volume
58
Issue
20
Year of publication
1998
Pages
R13419 - R13422
Database
ISI
SICI code
0163-1829(19981115)58:20<R13419:XRSOTS>2.0.ZU;2-Y
Abstract
We report x-ray reflectivity measurements of liquid mercury between -36 deg
rees C and +25 degrees C. The surface structure can be described by a layer
ed density profile convolved with a thermal roughness sigma(Tau). The layer
ing has a spacing of 2.72 Angstrom and an exponential decay length of 5.0 A
ngstrom. Surprisingly, sigma(Tau) is found to increase considerably faster
with temperature than the root Tau behavior predicted by capillary wave the
ory, in contrast with previous measurements on Ga and dielectric liquids. [
S0163-1829(98)52144-3]