Origins of positronium emitted from SiO2

Authors
Nagashima, Y Morinaka, Y Kurihara, T Nagai, Y Hyodo, T Shidara, T Nakahara, K
Citation
Y. Nagashima et al., Origins of positronium emitted from SiO2, PHYS REV B, 58(19), 1998, pp. 12676-12679
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
58
Issue
19
Year of publication
1998
Pages
12676 - 12679
Database
ISI
SICI code
0163-1829(19981115)58:19<12676:OOPEFS>2.0.ZU;2-V
Abstract
The time-of-flight of positronium emitted from single-crystal and amorphous SiO2 has been measured using a high-intensity pulsed positron beam at KEK. For both the samples, two components of peak energies around 1 and 3 eV ha ve been observed. They are attributed to the Ps formed in the bulk and on t he surface of the SiO2, respectively. [S0163-1829(98)03340-2].