Direct measurement of the resistivity weighting function

Authors
Citation
Dw. Koon et Wk. Chan, Direct measurement of the resistivity weighting function, REV SCI INS, 69(12), 1998, pp. 4218-4220
Citations number
8
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
69
Issue
12
Year of publication
1998
Pages
4218 - 4220
Database
ISI
SICI code
0034-6748(199812)69:12<4218:DMOTRW>2.0.ZU;2-7
Abstract
We have directly measured the resistivity weighting function - the sensitiv ity of a four-wire resistance measurement to local variations in resistivit y - for a square specimen of photoconducting material. This was achieved by optically perturbing the local resistivity of the specimen while measuring the effect of this perturbation on its four-wire resistance. The weighting function we measure for a square geometry with electrical leads at its cor ners agrees well with calculated results, displaying two symmetric regions of negative weighting which disappear when van der Pauw averaging is perfor med. (C) 1998 American Institute of Physics. [S0034-6748(98)03412-1].