We have directly measured the resistivity weighting function - the sensitiv
ity of a four-wire resistance measurement to local variations in resistivit
y - for a square specimen of photoconducting material. This was achieved by
optically perturbing the local resistivity of the specimen while measuring
the effect of this perturbation on its four-wire resistance. The weighting
function we measure for a square geometry with electrical leads at its cor
ners agrees well with calculated results, displaying two symmetric regions
of negative weighting which disappear when van der Pauw averaging is perfor
med. (C) 1998 American Institute of Physics. [S0034-6748(98)03412-1].