Hydrogen passivation effects in undoped p-ZnTe single crystals were studied
by photoluminescence (PL) and photoconductivity (PC) measurements. Samples
were exposed to r.f. hydrogen plasma at 250 degrees C for different durati
ons. Before passivation PL peaks were observed at 2.06 eV, 1.47 eV, 1.33 eV
and 1.06 eV. After 60 min of exposure, samples showed strong band edge gre
en luminescence at 2.37 eV due to an exciton bound to a Cu acceptor. In PC
studies the dark current decreased by a factor of 70 on passivation for 60
min. From the temperature dependence of PC gain, the minority carrier lifet
ime tau(n) was found to go through a maximum of 4.5 x 10(-7) s at 220 K bef
ore passivation. After 60 min of hydrogenation, tau(n) remained constant at
4.5 x 10(-7) s for T > 220 K and decreased for T < 220 K. The activation e
nergies of tau(n) have been determined and show marked changes on passivati
on for T > 220 K. Comparison between PL and PC studies showed that the deep
acceptor revel O-Te responsible for emission at 2.06 eV is passivated, giv
ing rise to strong band edge emission at 2.37 eV, while emission due to the
midgap impurity levels at 1.47, 1.33 and 1.05 eV remained unaffected. The
thermal activation energies of PL peaks have also been determined and allow
the construction of a defect energy level diagram for ZnTe.