Direct fabrication of polyimide waveguide grating by synchrotron radiation

Citation
J. Kobayashi et al., Direct fabrication of polyimide waveguide grating by synchrotron radiation, APPL PHYS L, 73(23), 1998, pp. 3336-3338
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
23
Year of publication
1998
Pages
3336 - 3338
Database
ISI
SICI code
0003-6951(199812)73:23<3336:DFOPWG>2.0.ZU;2-E
Abstract
Synchrotron radiation induces a change in the refractive index of a fluorin ated polyimide by an order of 10(-2), which is about ten times larger than the change it induces in silica glass irradiated by ultraviolet light, pres umably due to fluorine detachment and subsequent volume compaction. We have fabricated a 0.51-mu m-period grating structure in an embedded waveguide t hrough a 15-mu m-thick overcladding by using an x- ray mask with a spatiall y modulated pattern. The grating is fabricated at a dose of 160 A s and sho ws a reflectivity of 60% and a full width at half maximum as narrow as 0.25 nm at around a wavelength of 1.55 mu m. (C) 1998 American Institute of Phy sics. [S0003-6951(98)03849-2].