Measurement of temperature gradient in diode-laser-pumped high-power solid-state laser by low-coherence reflectometry

Citation
Sl. Huang et al., Measurement of temperature gradient in diode-laser-pumped high-power solid-state laser by low-coherence reflectometry, APPL PHYS L, 73(23), 1998, pp. 3342-3344
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
23
Year of publication
1998
Pages
3342 - 3344
Database
ISI
SICI code
0003-6951(199812)73:23<3342:MOTGID>2.0.ZU;2-O
Abstract
A noninvasive technique was developed to measure the temperature distributi on in laser gain medium. Both axial and radial temperature distributions of a diode-laser-pumped and intracavity frequency-doubled high-power Nd:YVO4/ KTP laser were characterized using a high dynamic range, low-coherence refl ectometer. This measurement is important to the design of high-power solid- state lasers both in terms of mode matching and laser-rod doping selection. (C) 1998 American Institute of Physics. [S0003-6951(98)03649-3].