Continuous-wave photoluminescence (PL) and time-resolved photoluminescence
of gallium nitride layers grown by pulsed laser deposition are compared. Th
e temperature dependence of the photoluminescence decay time and the PL-int
egrated intensity allows a determination of radiative and nonradiative time
constants of GaN. We find that luminescence peaks centered at 3.360 and 3.
305 eV at low temperature can be attributed to recombination of excitons lo
calized at extended defects. The photoluminescence radiative lifetime at ro
om temperature is on the order of tens of ns. (C) 1998 American Institute o
f Physics. [S0003-6951(98)00549-X].