A number of important optoelectronic device utilize the InAlGaAs/InP materi
al system. The reduction of carrier trapping at the In0.53Ga0.47As/In0.52Al
0.48As heterointerface is advantageous towards improving both the quantum e
fficiency and frequency response of devices utilizing InGaAs active regions
. Direct current and transient optical response characteristics were measur
ed for p-i-n double-heterojunction photodiodes utilizing either abrupt or s
uperlattice (SL) graded heterointerfaces. SL graded devices showed improved
collection efficiency at electric fields <3 kV/cm and faster temporal resp
onse at electric field <70 kV/cm as compared to identical devices having ab
rupt interfaces. (C) 1998 American Institute of Physics. [S0003-6951(98)016
49-0].