Modeling of profiles of X-ray diffraction reflections for gradient single crystals

X-ray diffraction by a one-dimensional gradient crystal with the regular va riations of the lattice metrics caused by the variation of the chemical com position along the growth direction is considered. The diffraction curves c alculated within the suggested model reliably describe the observed asymmet ric profiles of reflections from the growth face of a gradient K1-xRbxC8H5O 4 crystal (x = 0-0.25). It is shown that the gradients of the parameter b o btained in modeling and calculated based on the data of direct measurements are in good agreement.