We report electrically-detected magnetic resonance (EDMR) and electrol
uminescence-detected magnetic resonance (ELDMR) results on InGaN/AlCaN
single-quantum-well light emitting diodes. The dominant feature detec
ted by either technique is a broad resonance (Delta B approximate to 1
3 mT) at g approximate to 2.01 due to a deep defect. Depending on bias
, this defect results in either an increase or a decrease in electrolu
minescence at resonance while the EDMR gives a current enhancement at
resonance. Based on a comparison of signal intensities for the two mea
surements, we conclude that this defect is present in at least two loc
ations: (1) a nonradiative recombination path, in parallel with the ra
diative recombination path, and (2) a recombination channel in the dep
letion region of one of the contacts. A second resonance with g approx
imate to 1.99 and Delta B approximate to 7 mT is very similar to the d
eep donor trap, previously observed in double heterostructure diodes,
and produces a decrease in both the current and electroluminescence at
resonance. (C) 1997 American Institute of Physics.