Estimates of lightning-induced voltage stresses within buried shielded conduits

Citation
Fm. Tesche et al., Estimates of lightning-induced voltage stresses within buried shielded conduits, IEEE ELMAGN, 40(4), 1998, pp. 492-504
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
ISSN journal
00189375 → ACNP
Volume
40
Issue
4
Year of publication
1998
Part
2
Pages
492 - 504
Database
ISI
SICI code
0018-9375(199811)40:4<492:EOLVSW>2.0.ZU;2-R
Abstract
This paper examines the responses of four different types of shielded condu its to a direct lightning strike. The conduits are buried in the ground and fun between two shielded enclosures, one of which is struck by lightning. An induced current flows on the conduit and this induces a voltage on the i nner wires within the shield. Using a simple resistive model, this voltage is estimated and the effectiveness of the shielding provided by the various conduits is determined, A key element in the calculations is the transfer impedance of the conduits and an experimental program for determining these quantities is described. From this study, requirements for Lightning surge protection devices can be developed.