SEPARATION OF PLASMA IMPLANTATION OF OXYGEN TO FORM SILICON-ON-INSULATOR

Citation
X. Lu et al., SEPARATION OF PLASMA IMPLANTATION OF OXYGEN TO FORM SILICON-ON-INSULATOR, Applied physics letters, 70(13), 1997, pp. 1748-1750
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
70
Issue
13
Year of publication
1997
Pages
1748 - 1750
Database
ISI
SICI code
0003-6951(1997)70:13<1748:SOPIOO>2.0.ZU;2-O
Abstract
Separation by plasma implantation of oxygen (SPIMOX) is an economical method for silicon-on-insulator (SOI) wafer fabrication. This process employs the plasma immersion ion implantation (PIII) for the implantat ion of oxygen ions. The implantation rate, which is independent of the wafer size, is considerably higher than that of conventional implanta tion. The simpler implanter set-up is lower in cost and easier to main tain. The feasibility of SPIMOX has been demonstrated with successful fabrication of SOI structures implementing this process. The operation al phase space on implantation condition, oxygen dose, and annealing r equirement are identified. Secondary ion mass spectrometry analysis an d cross-sectional transmission electron microscopy micrographs of the SPIMOX sample showed continuous buried oxide under single crystal over layer with sharp silicon/oxide interfaces. (C) 1997 American Institute of Physics.