Separation by plasma implantation of oxygen (SPIMOX) is an economical
method for silicon-on-insulator (SOI) wafer fabrication. This process
employs the plasma immersion ion implantation (PIII) for the implantat
ion of oxygen ions. The implantation rate, which is independent of the
wafer size, is considerably higher than that of conventional implanta
tion. The simpler implanter set-up is lower in cost and easier to main
tain. The feasibility of SPIMOX has been demonstrated with successful
fabrication of SOI structures implementing this process. The operation
al phase space on implantation condition, oxygen dose, and annealing r
equirement are identified. Secondary ion mass spectrometry analysis an
d cross-sectional transmission electron microscopy micrographs of the
SPIMOX sample showed continuous buried oxide under single crystal over
layer with sharp silicon/oxide interfaces. (C) 1997 American Institute
of Physics.