GROWTH AND PROPERTIES OF C-AXIS TEXTURED LA0.7SR0.3MNO3-DELTA FILMS ON SIO2 SI SUBSTRATES WITH A BI4TI3O12 TEMPLATE LAYER/

Citation
Jy. Gu et al., GROWTH AND PROPERTIES OF C-AXIS TEXTURED LA0.7SR0.3MNO3-DELTA FILMS ON SIO2 SI SUBSTRATES WITH A BI4TI3O12 TEMPLATE LAYER/, Applied physics letters, 70(13), 1997, pp. 1763-1765
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
70
Issue
13
Year of publication
1997
Pages
1763 - 1765
Database
ISI
SICI code
0003-6951(1997)70:13<1763:GAPOCT>2.0.ZU;2-J
Abstract
c-axis textured La0.7Sr0.3MnO3-delta (LSMO) films were fabricated on S iO2/Si(001) substrates using a Bi4Ti3O12 (BTO) template layer. Electri cal and magnetic properties of LSMO were investigated. The LSMO/BTO la yer of this structure has no in-plane alignment. Even though a ferroma gnetic transition temperature, T-C, is as high as that of the epitaxia l LSMO film (360 K), a resistivity peak temperature, T-p, is about 140 K lower than T-C. The resistivity behavior as a function of temperatu re for LSMO/BTO/SiO2/Si films is found to be dominated by grain bounda ry effects. Low field sensitive magnetoresistance which suggests spin tunneling through the grain boundaries is also observed at room temper ature. (C) 1997 American Institute of Physics.