Photocatalytic degradation rate of oxalic acid on the semiconductive layerof n-TiO2 particles in the batch mode plate reactor - Part I: Mass transfer limits
J. Kulas et al., Photocatalytic degradation rate of oxalic acid on the semiconductive layerof n-TiO2 particles in the batch mode plate reactor - Part I: Mass transfer limits, J APPL ELEC, 28(8), 1998, pp. 843-853
Organic compounds dissolved in water can be decomposed on a layer of n-TiO2
particles irradiated by u.v. light, which generates holes and electrons in
the TiO2 material. Dissolved oxygen was used as electron scavenger and hol
es reacted with water to give OH radicals. The rate of degradation of the d
issolved organic compounds by OH radicals is limited by the transfer of eit
her oxygen or of the organic compounds to the surface of n-TiO2 particles.
The consequence of these limits is that, in the batch mode reactor with rec
irculation of the liquid, the dependence of the concentration of an organic
compound on time has either a linear or an exponential form. Experiments w
ith decomposition of oxalic acid in aqueous solutions using a plate reactor
(60 cm x 120 cm) confirmed the analysis. Equations for evaluation of the m
ass transfer coefficient of the dissolved species to the surface of the pla
te reactor with a moving liquid film were developed for the case of the thi
ckness of the Nernst diffusion layer being thinner than the thickness of th
e liquid. The experimentally obtained decomposition rate of oxalic acid was
about 60 to 80% of the theoretical decomposition rate limited by oxygen fl
ux through the film of a moving liquid. The present theory neglects the dif
fusion of oxygen into the porous layer of n-TiO2.