Effect of annealing of Ag ultrathin films on Co/Pt(111) surface

Citation
Cs. Shern et al., Effect of annealing of Ag ultrathin films on Co/Pt(111) surface, J APPL PHYS, 85(1), 1999, pp. 228-232
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
1
Year of publication
1999
Pages
228 - 232
Database
ISI
SICI code
0021-8979(19990101)85:1<228:EOAOAU>2.0.ZU;2-K
Abstract
Low-energy electron diffraction was used to study the annealing effects of Ag ultrathin films on the surface of one monolayer Co/Pt(111). The intensit y of the specular beam versus temperature has an unusual minimum point and maximum point. Further studies by Auger electron spectroscopy indicate that the adatoms of Ag become a best ordered state after the formation of Co-Pt alloy is complete. The new order state comes from the structure change of Co/Pt(111) and the smaller lattice mismatch between Ag and Pt. The electron density of states of d band shifts to a lower binding energy when the syst em starts to form the Co-Pt alloy measured by ultraviolet photoelectron spe ctroscopy. The chemical compositions at interfaces of the thin film were in vestigated by a depth profile before and after the annealing. The sputterin g rates of Ag on the topmost layer of the unannealed film and the annealed film were calculated and comparatively studied. A shadow effect causes the different sputtering rates of these two ultrathin films. (C) 1999 American Institute of Physics. [S0021-8979(98)06024-1].