Two-step kinetics of As/P exchange reaction

Citation
Ky. Suh et al., Two-step kinetics of As/P exchange reaction, J APPL PHYS, 85(1), 1999, pp. 233-236
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
1
Year of publication
1999
Pages
233 - 236
Database
ISI
SICI code
0021-8979(19990101)85:1<233:TKOAER>2.0.ZU;2-F
Abstract
A simple two-step mechanism is used to derive the kinetics of the As/P exch ange reaction which takes place on an epitaxially grown InP surface exposed to As flux. The first step involves surface exchange of arsenic with phosp horus, which is then followed by the second step, bulk exchange of arsenic (arsenic incorporation). Two possible choices are investigated for bulk exc hange: the same exchange rate constant in the bulk and the same ratio of ex change rate constants in the bulk. Transient and steady-state profiles of A s composition and the maximum depth of the As/P exchange reaction are deriv ed analytically. (C) 1999 American Institute of Physics. [S0021-8979(99)046 01-0].