A simple two-step mechanism is used to derive the kinetics of the As/P exch
ange reaction which takes place on an epitaxially grown InP surface exposed
to As flux. The first step involves surface exchange of arsenic with phosp
horus, which is then followed by the second step, bulk exchange of arsenic
(arsenic incorporation). Two possible choices are investigated for bulk exc
hange: the same exchange rate constant in the bulk and the same ratio of ex
change rate constants in the bulk. Transient and steady-state profiles of A
s composition and the maximum depth of the As/P exchange reaction are deriv
ed analytically. (C) 1999 American Institute of Physics. [S0021-8979(99)046
01-0].