Sizing particles on substrates: A general method for oblique incidence

Citation
Jl. De La Pena et al., Sizing particles on substrates: A general method for oblique incidence, J APPL PHYS, 85(1), 1999, pp. 432-438
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
1
Year of publication
1999
Pages
432 - 438
Database
ISI
SICI code
0021-8979(19990101)85:1<432:SPOSAG>2.0.ZU;2-K
Abstract
We have developed an experimental light-scattering method to size metallic spherical and cylindrical particles on flat substrates using obliquely inci dent light. We modify an earlier model to include effects such as the shado wing of the incident and scattered beams. We provide empirical expressions for sizing spheres and cylinders on substrates based on the positions of th eir minima. The results have been experimentally verified for both types of particle. The extension of the method to oblique incidence angles allows a n alternative dynamic procedure. (C) 1999 American Institute of Physics. [S 0021-8979(99)08301-2].