Nanometer-sized Cr clusters in the size range of 7.6-13 nm have been produc
ed by a plasma-gas-condensation-type cluster deposition apparatus, which co
mbines a grow-discharge sputtering technique with an inert gas condensation
technique. We have studied influences of the Ar gas pressure, P-Ar, and th
e Ar gas flow rate, V-Ar, on the size distribution of Cr clusters by transm
ission electron microscopy. Monodispersed Cr clusters are formed at both lo
w P-Ar and low V-Ar. At low P-Ar, Cr clusters nucleate and grow only in the
liquid-nitrogen-cooled growth region, and the deposition rate is rather lo
w. At high P-Ar, on the other hand, a large amount of Cr clusters are forme
d even near the sputtering source, and the nucleation and growth occur over
a wide region between the sputtering source and the growth region. Under t
his condition, the deposition rate is relatively high. Consequently, the fo
rmation mechanism of the monodispersed clusters is similar to that of monod
ispersed colloidal particles: The nucleation and growth processes are defin
itely separated and the coagulation of growing particles is prohibited. In
the present experiments, these conditions are effectively attained by using
a carrier gas flow and liquid-nitrogen-cooling of the cluster growth regio
n. (C) 1999 American Institute of Physics. [S0021-8979(99)03701-9].