Anisotropic defect structure and transport properties of YBa2Cu3O7-delta films on vicinal SrTiO3(001)

Authors
Brotz, J Fuess, H Haage, T Zegenhagen, J Jooss, C Forkl, A Warthmann, R
Citation
J. Brotz et al., Anisotropic defect structure and transport properties of YBa2Cu3O7-delta films on vicinal SrTiO3(001), J APPL PHYS, 85(1), 1999, pp. 635-637
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
1
Year of publication
1999
Pages
635 - 637
Database
ISI
SICI code
0021-8979(19990101)85:1<635:ADSATP>2.0.ZU;2-#
Abstract
The microstructure of YBa2Cu3O7-delta thin films grown on vicinal SrTiO3 (0 01) has been studied as a function of the vicinal angle by x-ray diffractio n using the two-dimensional q-scan technique. Our results reveal a strong c orrelation between the miscut of a SrTiO3 (001) substrate and the anisotrop ic defect structure of the film. Furthermore, we observed an anisotropy of the corresponding critical current density up to 4.6 depending on the angle of miscut. (C) 1999 American Institute of Physics. [S0021-8979(99)09401-3] .