Mapping of the hot spots for DNA damage by one-electron oxidation: Efficacy of GG doublets and GGG triplets as a trap in long-range hole migration

Authors
Saito, I Nakamura, T Nakatani, K Yoshioka, Y Yamaguchi, K Sugiyama, H
Citation
I. Saito et al., Mapping of the hot spots for DNA damage by one-electron oxidation: Efficacy of GG doublets and GGG triplets as a trap in long-range hole migration, J AM CHEM S, 120(48), 1998, pp. 12686-12687
Citations number
27
Categorie Soggetti
Chemistry & Analysis",Chemistry
Journal title
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
ISSN journal
00027863 → ACNP
Volume
120
Issue
48
Year of publication
1998
Pages
12686 - 12687
Database
ISI
SICI code
0002-7863(199812)120:48<12686:MOTHSF>2.0.ZU;2-V