Na. Sanford et Ja. Aust, Nonlinear optical characterization of LiNbO3. I. Theoretical analysis of Maker fringe patterns for x-cut wafers, J OPT SOC B, 15(12), 1998, pp. 2885-2909
Marker fringe analysis was adapted to x-cut LiNbO3 wafers to examine variat
ions in birefringence, thickness, and photoelastic strain. The pump beam wa
s polarized parallel to the crystalline gamma axis and produced e- and o-po
larized Maker fringes, owing to d(31) and d(22), respectively, by rotation
of the sample about they y axis. Fitting our model to the o-polarized data
enabled computation of the sample thickness to an uncertainty of approximat
ely +/-0.01 mu m. The accuracy was limited by an implicit +/-2 x 10(-4) unc
ertainty in n(o) that exists in the commonly used Sellmeier equation of G.
J. Edwards and M. Lawrence, Opt. Quantum Electron. 16, 373 (1984). For a pu
mp wavelength lambda(p) = 1064 nm, fitting the model to the e-polarized fri
nges revealed that n(e) at 532 nm deviated from the Sellmeier result by typ
ically -1.58 x 10-4. The uniformity of n(e) over a wafer 10 cm in diameter
was approximately +/-4 x 10(-5). This result is consistent with that expect
ed from compositional variations. Our model included multiple passes of the
pump and second-harmonic waves. The effects of photoelastic strain in prod
ucing perturbations and mixing of the e- and a-polarized fringes was invest
igated. This was restricted to two experimentally motivated cases that sugg
ested that strains produce rotations of the optic axis by typically +/-0.05
degrees about the x axis and y axis with the former assigned to an indeter
minant combination of S-1, S-2, and S-4 and the latter to an indeterminant
combination of S-5 and S-6. In both cases the magnitude of the collective s
trains is of the order of 10(-4). The birefringence variations that are due
to strain are of the same magnitude as those expected from compositional v
ariations. The formalism developed here is used in the subsequent mapping s
tudy of x-cut wafers. (C) 1998 Optical Society of America [S0740-3224(98)00
412-3] OCIS codes: 160.3730, 160.4330, 190.1900, 190.4400.