We have investigated a simple yet powerful method for making sharp scanning
tunneling microscopy tips of Pt/Ir. It consists of three electrochemical p
olish/etch steps, not requiring any special micropolishing. The tips, as se
en by high-resolution transmission electron microscopy, are sharper than 20
Angstrom. Furthermore, they are smooth, without mini tips and covered with
an oxide layer not much thicker than the native one (as seen from a freshl
y cut wire) when all three steps are applied. (C) 1998 American Vacuum Soci
ety. [S0734-211X(98)06006-5].