Enabling in situ atomic-scale characterization of epitaxial surfaces and interfaces

Authors
Smathers, JB Bullock, DW Ding, Z Salamo, GJ Thibado, PM Gerace, B Wirth, W
Citation
Jb. Smathers et al., Enabling in situ atomic-scale characterization of epitaxial surfaces and interfaces, J VAC SCI B, 16(6), 1998, pp. 3112-3114
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
16
Issue
6
Year of publication
1998
Pages
3112 - 3114
Database
ISI
SICI code
1071-1023(199811/12)16:6<3112:EISACO>2.0.ZU;2-5