An organic scintillator has been developed for use in electron-beam lithogr
aphy. The scintillator can be deposited in a thin film (<200 nm) on the sub
strate, and can be patterned by an ultraviolet-interferometric exposure to
produce a uniformly thick, scintillating, fiducial grid. When scanned with
the electron beam, the scintillating pattern produces a high-contrast (>2)
optical signal. It is expected that the signal from this type of-grid will
improve the pattern-placement precision. to within 1 nm when used in conjun
ction with spatial-phase-locked electron-beam lithography. (C) 1998 America
n Vacuum Society. [S0734-211X(98)02106-4].