A self-aligned metallic single-electron tunneling transistor was fabricated
on a Separated by Implanted Oxygen substrate. An array of 10-50 gold islan
ds of 1-3 nm diameter was isolated between source and drain electrodes on a
silicon nanowire. This design reduces the number of transport paths by res
tricting the number of active nanodots between source and drain. The island
s were deposited by a retarding field single ion deposition method, whereby
the island sizes and separations could be varied by adjusting landing ener
gy and dose. An undercut beneath the nanowire was used to separate the side
gates from the multiple tunnel junction. Coulomb blockade was observed in
the source drain characteristics at 77 K. (C) 1998 American Vacuum Society.
[S0734-211X(98)04506-5].