A novel method for the measurement of Young's modulus for thick-film resistor material by flexural testing of coated beams

A method for measuring the Young's modulus of thick-film resistor material is presented. 96% alumina beams were coated with Heraeus 8241 resistor mate rial and flexural tested in the three-point bend mode using a DMA 2980 Ther mal Mechanical Analyser. Young's modulus was found to decrease linearly ove r the 173 K to 573 K temperature range. There was no evidence of non-elasti c behaviour. Modulus results for the alumina substrate relate closely to pu blished data. This method could be used to measure the modulus of a wide va riety of thick-film coatings on substrates.