N. Fawcett, A novel method for the measurement of Young's modulus for thick-film resistor material by flexural testing of coated beams, MEAS SCI T, 9(12), 1998, pp. 2023-2026
A method for measuring the Young's modulus of thick-film resistor material
is presented. 96% alumina beams were coated with Heraeus 8241 resistor mate
rial and flexural tested in the three-point bend mode using a DMA 2980 Ther
mal Mechanical Analyser. Young's modulus was found to decrease linearly ove
r the 173 K to 573 K temperature range. There was no evidence of non-elasti
c behaviour. Modulus results for the alumina substrate relate closely to pu
blished data. This method could be used to measure the modulus of a wide va
riety of thick-film coatings on substrates.