Study of near-field coupling phenomena in slotted screens using the generalized circuital analysis

Authors
Balbastre, JV Nuno, L Diaz, A
Citation
Jv. Balbastre et al., Study of near-field coupling phenomena in slotted screens using the generalized circuital analysis, MICROW OPT, 20(1), 1999, pp. 40-44
Citations number
5
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
20
Issue
1
Year of publication
1999
Pages
40 - 44
Database
ISI
SICI code
0895-2477(19990105)20:1<40:SONCPI>2.0.ZU;2-5
Abstract
A generalized circuital analysis (GCA), together with the finite-element me thod (FEM) is proposed to study the near-field coupling phenomena arising i n slotted envelopes covering electronic devices. The proposed approach is v ery systematic and versatile. (C) 1999 John Wiley & Sons, Inc.