High resolution transmission electron microscopy of GeV heavy ion irradiated graphite

In this paper, we present some results relative to irradiations of natural and synthetic graphite with similar to 1 GeV lead and uranium ions. High re solution transmission electron microscopy reveals no tracks in the bulk in either kinematic or diffraction contrast. Small surface patches are formed however random in distribution and proportional in number, but not equivale nt to the total ion fluence, This suggests that some matter could be ejecte d from the entry and exit surfaces by electronic processes and are then red eposited on the surfaces. (C) 1998 Published by Elsevier Science B.V. All r ights reserved.