S. Yoneyama et M. Takashi, A new method for photoelastic fringe analysis from a single image using elliptically polarized white light, OPT LASER E, 30(5), 1998, pp. 441-459
A new two-dimensional photoelastic method for the analysis of fringe order
and the principal direction of birefringence from a single image combining
an elliptically polarized white light and color image processing is demonst
rated. To determine fringe order, a database-search approach based on the p
rimary color analysis is employed. After determining fringe order, the prin
cipal direction of birefringence is obtained by solving a non-linear equati
on. The equation of emerging light intensity is derived and the theory of t
he proposed method is described. Then, the successful application of the me
thod to photoelastic analysis is shown. It is emphasized that the proposed
method can be applicable to time-varying phenomena since multiple exposures
are not necessary for sufficient data acquisition for the completion of st
ress analysis. (C) 1998 Elsevier Science Ltd. All rights reserved.