Optical functions of chromium disilicide epitaxial films in the 0.35-6.2-eV energy ranger the semiempirical simulation

The real and imaginary parts of the dielectric function epsilon(E) = epsilo n(1)(E) + i epsilon(2)(E) were calculated from reflection spectra of chromi um disilicide epitaxial films with the use of the Kramers-Kronig integral r elations in the 0.35- to 6.2-eV energy range at room temperature A semiempi rical model of the dielectric function for the A-type CrSi2 epitaxial films was derived on the basis of the available theoretical calculations of the energy-band structure of CrSi2 single crystals and the data of the optical reflection spectroscopy, The integrated spectra of the dielectric function were decomposed into the contributions from seven noninteracting harmonic o scillators and the parameters of these oscillators were evaluated. A satisf actory agreement was obtained between the experimental spectra and the spec tra of complex refractive index and reflection coefficient as calculated on the basis of the model suggested.