Monte Carlo simulation of charge-trapped effects on dispersive electronic transient transport

By means of the Monte Carlo technique the possible mechanism responsible fo r charge trapping at the region of photogeneration of:nonequilibrium charge , in dispersive transient transport measurements, was studied. The typical curves for dispersive transport with the effect of trapped charge were simu lated. The temperature dependence of the simulated currents and the corresp onding experimentally obtained currents, measured by the time of flight tec hnique, were compared. A good agreement between experimental and simulated results was obtained, and a model for the mechanism of charge trapping at t he photogeneration region is proposed. [S0163-1829(98)03035-8].