This paper describes various aspects of noise modeling in devices under non
linear operation. After a presentation of the parameters required to comple
tely model the noise performance in a nonlinear device, a generalization of
the impedance field method is proposed for the calculation of the macrosco
pic noise sources. High frequency and then low frequency microscopic noise
processes are considered. It is shown that the impedance field method is fo
rmulated differently for these two noise processes. (C) 1998 Elsevier Scien
ce Ltd. All rights reserved.