Noise analysis in devices under nonlinear operation

Citation
A. Cappy et al., Noise analysis in devices under nonlinear operation, SOL ST ELEC, 43(1), 1999, pp. 21-26
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
43
Issue
1
Year of publication
1999
Pages
21 - 26
Database
ISI
SICI code
0038-1101(199901)43:1<21:NAIDUN>2.0.ZU;2-H
Abstract
This paper describes various aspects of noise modeling in devices under non linear operation. After a presentation of the parameters required to comple tely model the noise performance in a nonlinear device, a generalization of the impedance field method is proposed for the calculation of the macrosco pic noise sources. High frequency and then low frequency microscopic noise processes are considered. It is shown that the impedance field method is fo rmulated differently for these two noise processes. (C) 1998 Elsevier Scien ce Ltd. All rights reserved.