X-ray microbeam quantification of grain subdivision accompanying large deformations of copper

This work reports the application of X-ray microbeam diffraction to quantif ying grain subdivision processes in copper. Polychromatic synchrotron X-rad iation was used to study samples in the as-received (low deformation) and 1 00% torsion strained material. The large range of domain disorientations (w ithin individual grains) observed in the highly strained material agrees wi th results on other f.c.c. materials obtained by electron beam methods; it is not surprising, therefore, that models of texture development which do n ot include this effect predict too rapid sharpening of preferred orientatio n compared to experimental pole figures. (C) 1998 Acta Metallurgica Inc. Pu blished by Elsevier Science Ltd. All rights reserved.