Characterization of glass-epoxy adhesion using JKR methods and atomic force microscopy

Citation
Dl. Woerdeman et al., Characterization of glass-epoxy adhesion using JKR methods and atomic force microscopy, COMPOS P A, 30(1), 1999, pp. 95-109
Citations number
40
Categorie Soggetti
Material Science & Engineering
Journal title
COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING
ISSN journal
1359835X → ACNP
Volume
30
Issue
1
Year of publication
1999
Pages
95 - 109
Database
ISI
SICI code
1359-835X(1999)30:1<95:COGAUJ>2.0.ZU;2-G
Abstract
The adhesion between an industrial-grade epoxy elastomer and a silanated gl ass surface was studied using the JKR (lohnson, Kendall and Roberts) techni que. Both short-term and longer-term interactions were monitored between th e two components. Different silane coupling agents and coating procedures a re applied to the glass surfaces, and their effects on the adhesion measure ments are investigated. The topography of the silanated surfaces was studie d using atomic force microscopy, and correlations were made with the JKR ad hesion data. An extensive error analysis was also conducted in an attempt t o extract the deterministic content of the data from experimental scatter. (C) 1998 Published by Elsevier Science Ltd. All rights reserved.