Comparative SEU sensitivities to relativistic heavy ions

Authors
Koga, R Crain, SH Crain, WR Crawford, KB Hansel, SJ
Citation
R. Koga et al., Comparative SEU sensitivities to relativistic heavy ions, IEEE NUCL S, 45(6), 1998, pp. 2475-2482
Citations number
40
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
45
Issue
6
Year of publication
1998
Part
1
Pages
2475 - 2482
Database
ISI
SICI code
0018-9499(199812)45:6<2475:CSSTRH>2.0.ZU;2-P
Abstract
SEU sensitivity of microcircuits to relativistic heavy ions is compared to that measured with low energy ions of comparable LET values. Multiple junct ion charge collection in a complex circuit seems to mask the effect of vary ing charge generations due to different ion track structures. Heavy ions at sub-relativistic speeds may generate nuclear fragments, sometimes resultin g in SEUs.