P. Roche et al., SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domain, IEEE NUCL S, 45(6), 1998, pp. 2534-2543
The first SEU response of a complete 3-D SRAM cell is presented. This simul
ation method allows to verify the accuracy of the commonly used mixed-mode
technique and to study coupling effects between different junctions of the
cell.