Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

Data are presented on several low dose rate sensitive bipolar linear circui ts to evaluate a proposed hardness assurance method. The circuits include p rimarily operational amplifiers and voltage comparators with a variety of s ensitive components and failure modes. The proposed method, presented in 19 97, includes an option between a law dose rate test at 10 mrd(Si)/s and roo m temperature and a 100 degrees C elevated temperature irradiation test at a moderate dose rate. The results of this evaluation demonstrate that a 10 mrd(Si)/s test is able (in all but one case) to bound the worst case respon se within a factor of 2. For the moderate dose rate, 100 degrees C test the worst case response is within a factor of 3 for 8 of 11 circuits, and for some circuits overpredicts the low dose rate response. The irradiation bias used for these tests often represents a more degrading bias condition than would be; encountered in a typical space system application.