Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry

Authors
Dusseau, L Polge, G Albert, L Magnac, Y Bessiere, JC Fesquet, J Gasiot, J
Citation
L. Dusseau et al., Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry, IEEE NUCL S, 45(6), 1998, pp. 2695-2699
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
45
Issue
6
Year of publication
1998
Part
1
Pages
2695 - 2699
Database
ISI
SICI code
0018-9499(199812)45:6<2695:IICDMU>2.0.ZU;2-Y
Abstract
The feasibility of a dose mapping system using Optically Stimulated Lumines cent (OSL) Phosphors is demonstrated. The OSL technique is briefly reviewed as well as its interest for calculation codes calibration. The sensors and the reading apparatus are presented. An example of attenuation dose map ob tained for a Dual In Line Plastic Package (DIL) is given and the results co mpared to calculations with the code EGS4 PRESTA. Results obtained by exper iment and simulation are discussed as well as the potentialities of the met hod.