Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications

The first results obtained using a SOI device for microdosimetry applicatio ns are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A sp ectroscopy model is presented which includes the majority of effects that i mpact spectral resolution. Charge collection statistics were found to subst antially affect spectral resolution. Lateral diffusion effects significantl y complicate charge collection.