Possible role for secondary particles in proton-induced single event upsets of modern devices

Authors
Savage, MW McNulty, PJ Roth, DR Foster, CC
Citation
Mw. Savage et al., Possible role for secondary particles in proton-induced single event upsets of modern devices, IEEE NUCL S, 45(6), 1998, pp. 2745-2751
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
45
Issue
6
Year of publication
1998
Part
1
Pages
2745 - 2751
Database
ISI
SICI code
0018-9499(199812)45:6<2745:PRFSPI>2.0.ZU;2-#
Abstract
Increases in the SEU sensitivity of some modern COTS devices suggest that o ther reactions besides the direct spallation reaction may begin to play a r ole in proton SEU events, but only in devices with upset thresholds signifi cantly lower than devices currently flown in space or sold commercially for terrestrial applications. Triple coincidence tagged proton exposures and n eutron exposures are combined to demonstrate these reactions in the same de vice.