SEU induced errors observed in microprocessor systems

Authors
Asenek, V Underwood, C Velazco, R Rezgui, S Oldfield, M Cheynet, P Ecoffet, R
Citation
V. Asenek et al., SEU induced errors observed in microprocessor systems, IEEE NUCL S, 45(6), 1998, pp. 2876-2883
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
45
Issue
6
Year of publication
1998
Part
1
Pages
2876 - 2883
Database
ISI
SICI code
0018-9499(199812)45:6<2876:SIEOIM>2.0.ZU;2-K
Abstract
In this paper, we present software tools for predicting the rate and nature of observable SEU induced errors in microprocessor systems. These tools ar e built around a commercial microprocessor simulator and are used to analys e real satellite application systems. Results obtained from simulating the nature of SEU induced errors are shown to correlate with ground-based radia tion test data.