Ip. Hong et al., Analysis on the effect of metal penetrating depth into the anisotropic substrate in a shielded microstripline, INT J RF MI, 9(1), 1999, pp. 49-53
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
This article describes the quasistatic analysis of a shielded microstriplin
e with finite metallization thickness penetrating into the anisotropic subs
trate. A vertical directional mode-matching method, which includes eigenfun
ctions with inhomogeneous properties for analyzing this structure, has been
used. This method not only provides a simple and fast approach to the quas
istatic analysis of inhomogeneous structures, but also can be applied to an
alyze the effect of metal penetration into the anisotropic substrate. The r
esults show that the characteristic impedances of a shielded microstripline
can be represented as a function of the ship width, the metal thickness, a
nd the metal penetrating depth into the substrate. (C) 1999 John Wiley & So
ns, Inc.