T. Nakagawa et al., Production of highly charged Xe ions from the RIKEN 18 GHz electron cyclotron resonance ion source using a biased electrode, JPN J A P 1, 37(11), 1998, pp. 6215-6216
We have observed the enhancement of Xe-30,Xe-32+ ion beam intensity from th
e RIKEN 18 GHz electron cyclotron resonance ion source (ECRIS) using an ele
ctrode at bias voltage of similar to -100 V. We have successfully obtained
beam intensities of 11 e mu A for the Xe30+ ion beam and 4 e mu A for the X
e32+ ion beam using this method at an extraction voltage of 13 kV.