A single-crystalline MgO film was grown on GaAs(001) by constructing a comp
lex heterostructure with two alkali halide buffer layers. The growth temper
ature was decreased to 150 degrees C as compared with direct growth of MgO
on GaAs(001). Electron energy loss spectrum of the grown film agreed well w
ith that of bulk MgO, indicating that surface stoichiometry was maintained.
The structure was stable up to 600 degrees C against heating in UHV condit
ion. The concept of a complex heterostructure will help fabrication of func
tional oxide layers on GaAs substrates and lead to oxide/semiconductor inte
grated devices.