Preparation and characterization of (Ba1-xSrx)TiO3 films by sol-gel processing

Citation
A. Tsuzuki et al., Preparation and characterization of (Ba1-xSrx)TiO3 films by sol-gel processing, J MATER SCI, 33(12), 1998, pp. 3055-3058
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
33
Issue
12
Year of publication
1998
Pages
3055 - 3058
Database
ISI
SICI code
0022-2461(19980615)33:12<3055:PACO(F>2.0.ZU;2-X
Abstract
Barium strontium titanate ((Ba, Sr)TiO3) thin films were prepared on Pt/Ti/ Si substrates by the sol-gel method using metal alkoxides. The dependence o f the dielectric constant for the films on the film compositions and on the film thickness were investigated. The dielectric constant of the fi Im of thickness 180 nm had the highest value of 230 at composition ratios of [Ba + Sr]/[Ti] = 1.04 and [Sr]/[Ba + Sr] = 0.6. The dielectric constant of the films with this composition decreased from 390 to 160 with a decrease in th e film thickness from 440 to 100 nm. The decrease in the dielectric constan t with increasing film thickness is attributed to the existence of a low-di electric-constant interface layer adjacent to the electrodes. (C) 1998 Kluw er Academic Publishers.