Ddb. Filho et al., Niobia films: surface morphology, surface analysis, photoelectrochemical properties and crystallization process, J MATER SCI, 33(10), 1998, pp. 2607-2616
The photoelectrochemical properties of set-gel Nb2O5 coatings have been dis
cussed in terms of their surface morphology. Niobium chloroalkoxide solutio
n was prepared and thin films were deposited by dip-coating on the indium-t
in oxide conductor glass. Structural, optical and electro-properties of amo
rphous and crystalline sol-gel coatings have been determined. Powders were
prepared by the hydrolysis of amorphous niobium and were characterized by X
-ray diffraction and electron paramagnetic resonance. These measurements in
dicated which changes were introduced in the photoelectrical behaviour of t
he semiconductor due to its crystalline structure. The absorption measureme
nts showed an absorption band in the ultraviolet range associated with the
electronic transfer O2- --> Nb5+ whose energy gap was around 3.3 eV. The ph
otoelectrochemical measurements for the coatings were done in lithium percl
orate and were used to determine the flat band potential, V-bp, and the ele
ctron diffusion length, L. The influence of particle sizes in the charge-tr
ansfer process at the semiconductor-electrolyte interface was discussed acc
ording to the models of Gartner and Sodergren. (C) 1998 Chapman & Hall.