X-ray emission for Ar ions impacting on SiO2

Authors
Lehnert, U Stockli, MP Cocke, CL
Citation
U. Lehnert et al., X-ray emission for Ar ions impacting on SiO2, J PHYS B, 31(23), 1998, pp. 5117-5122
Citations number
27
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
ISSN journal
09534075 → ACNP
Volume
31
Issue
23
Year of publication
1998
Pages
5117 - 5122
Database
ISI
SICI code
0953-4075(199812)31:23<5117:XEFAII>2.0.ZU;2-A
Abstract
We have observed X-ray spectra for 20-2720 keV Ar ions in charge states fro m 4 through 17 impacting on an SiO2 surface at 60 degrees from normal incid ence. Besides x-rays from the K-shell filling in the case of Ar17+, We obse rve characteristic silicon K-shell radiation. The intensity of this radiati on is analysed in terms of x-ray fluorescence and vacancy transfer in close atomic collisions.