Detailed structure of molecularly thin polyelectrolyte multilayer films onsolid substrates as revealed by neutron reflectometry

Citation
M. Losche et al., Detailed structure of molecularly thin polyelectrolyte multilayer films onsolid substrates as revealed by neutron reflectometry, MACROMOLEC, 31(25), 1998, pp. 8893-8906
Citations number
23
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
MACROMOLECULES
ISSN journal
00249297 → ACNP
Volume
31
Issue
25
Year of publication
1998
Pages
8893 - 8906
Database
ISI
SICI code
0024-9297(199812)31:25<8893:DSOMTP>2.0.ZU;2-J
Abstract
Using neutron reflectometry we have resolved-to high resolution-the interna l structure of self-assembled polyelectrolyte multilayer films and have dev eloped a detailed molecular picture of such systems by analyzing the data w ith a composition-space refinement technique. We show that such surface fil ms consist of stratified structures in which polyanions and polycations of individual layers interdigitate one another intimately. Nevertheless, the d eposition technique leads to results that are predictable, if well-defined and constant environmental conditions are maintained during the preparation . For alternating layers of poly(styrenesulfonate) (PSS) and poly(allylamin e hydrochloride) (PAH), adsorbed onto atomically flat surfaces, a roughenin g of successively deposited layers leads to a progressively larger number o f adsorption sites for consecutive generations of adsorbed polymer, and thu s to an increase in layer thicknesses with an increasing number of deposite d layers. Because of the interpenetration of adjacent polyelectrolyte speci es, however, this increase settles quickly into an equilibrium thickness. I n fully hydrated films (100% relative humidity), water occupies greater tha n or equal to 40% of the volume within the films. About twice as much water (by volume) is associated with PSS as with PAH. Incorporated inorganic sal t plays a minor role only, if any. The equilibrium thickness of the deposit ed layer structure may be fine-tuned via the ionic strength, I, of the solu tions used for the preparation. We show that the dependence of the thicknes s d(1p) per layer pair on I is linear, with a sensitivity, Delta d(1p)/Delt a I = 16 Angstrom x L/mol. Concurrently with the layer thickness the interf ace roughness sigma between adjacent layers increases: sigma similar to 0.4 x d(1p). In contrast to the ionic strength of the deposition solutions, th e degree of polymerization of the polyanions used in the preparation plays a minor role only in determining the overall structure of the deposited fil ms. The results reported here are quantitatively consistent with those of a recent study (Tarabia et al. J. Appl. Phys. 1998, 83, 725-732), if one ass umes that the hydration of the polyelectrolyte molecules in the sample film s investigated in the two studies is similar.